E-007 — Functional Block Diagram — Accordion Test Adapter R1 concept
Created by demo · 2026-06-08
Details
Hypothesis
Top-level functional decomposition of the Accordion Test Adapter R1, agreed during concept session 2026-06-08.
Bus topology (2026-06-09):
- UART · SPI: series daisy-chain through all module slots
- I2C: unique per slot — pin-strap selects which slot to address (1-of-4)
graph LR
USBPD["USB PD
20V"]
FTDI["FTDI USB-Serial
Vertical USB · REQ-003"]
subgraph A2_LINK["Accordion A2 link"]
CTOP["Com-Top
input connector"]
end
subgraph PWR["Power Management"]
PM["20V distribution
5V / 3V3 / 1V8 generation
2.5V VREF = module 2.5V rail
Per-slot switches ≥1A
Shunt meas. 0–1A · Power LEDs"]
end
I2C_SW["I2C Slot Select
Pin-strap · DEC-002
1-of-4"]
NTOP["N-Top"]
SODIMM["SO-DIMM"]
M2["M.2"]
CTOP_OUT["Com-Top
reg + mini"]
USBPD -->|"20V"| PM
CTOP -->|"20V"| PM
CTOP -->|"I2C"| I2C_SW
I2C_SW -.->|"selects 1 slot"| NTOP & SODIMM & M2 & CTOP_OUT
CTOP -->|"UART · SPI"| NTOP -->|"UART · SPI"| SODIMM -->|"UART · SPI"| M2 -->|"UART · SPI"| CTOP_OUT
PM -->|"20V · 5V · 3V3 · 2.5V · 1V8"| NTOP & SODIMM & M2 & CTOP_OUT
FTDI --> NTOP & SODIMM & M2 & CTOP_OUT
Key decisions reflected
- DEC-001: 20V from USB PD
- DEC-002: I2C slot select via pin-strap (1-of-4; I2C originates from A2 via Com-Top)
- DEC-003: Local 5V, 3V3, 1V8 generation
- DEC-004: All rails (20V, 5V, 3V3, 2.5V, 1V8) to every module slot, max 1A per slot
- DEC-005: 2.5V VREF (REQ-001) serves as the module slot 2.5V rail
Open questions
None — all FBD-level questions resolved.
Next step
DS.01 schematic capture.